Difference between revisions of "Low Resolution-Often Repeated"

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[[Category:Design_patterns]] <!-- List of other categories the design pattern belongs to. The syntax for linking to a category is: [[Category:<Name of category]] -->
[[Category:Design_patterns]] [[Category:Patlet]]<!-- List of other categories the design pattern belongs to. The syntax for linking to a category is: [[Category:<Name of category]] -->

Revision as of 15:06, 4 May 2017


Low Resolution-Often Repeated
Contributors Joseph Bergin, Christian Kohls, Christian Köppe, Yishay Mor, Michel Portier, Till Schümmer, Steven Warburton
Last modification May 4, 2017
Source Bergin et al. (2016)[1]
Pattern formats OPR Alexandrian
Usability
Learning domain
Stakeholders


Rather than a few high risk assessments in a course, use many low impact measures that accumulate.


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Problem

Forces

Solution

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Evidence

Literature

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Data

Applied evaluation

Related patterns

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References

  1. Bergin, J., Kohls, C., Köppe, C., Mor, Y., Portier, M., Schümmer, T., & Warburton, S. (2016). Student's choice of assessment. In Proceedings of the 21st European Conference on Pattern Languages of Programs (EuroPLoP 2016) (p. 22). ACM.